Our Products Coating Thickness - EDXRF (Energy Dispersive X-ray Fluorescence) Electroplating and Electroless Coatings
Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard.
XDL 210: Plane support stage, fixed Z-axis
XDL 220: Plane support stage, motor-driven Z-axis
XDL 230: Manually operable XY-stage, motor-driven Z-axis
XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
Measurement of electroplated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on printed circuit boards
Solution analysis in the electroplating
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to
determine thin coatings and for the solution analysis.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Top down
X-ray tube:Tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 0.3 mm (11.8 mils), Optional: Ø 0.1 mm (3.9 mils), Ø 0.2 mm (7.9 mils),
slot 0.3 x 0.05 mm (11.8 x 2 mils)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot: approx.
Ø 0.2 mm (7.9 mils)
X-ray detector:Proportional counter tube
Measuring distance:0 … 80 mm (0 … 3.2 in)
Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the
measurement location along the primary beam axis,Crosshairs with a
calibrated scale (ruler) and spot-indicator,Adjustable LED illumination
Zoom factor:Digital 1x, 2x, 3x, 4x
Computer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
| Sample Stage | ||||
|---|---|---|---|---|
| XDL 210 | XDL 220 | XDL 230 | XDL 240 | |
| Design | Fixed sample Support | Fixed sample Support | Manual XY-stage | Programmable XY-stage |
| Maximum travel XY | - | - | 95 x 150 mm (3.7 x 5.9 in) | 255 x 235 mm (10 x 9.2 in) |
| Travel speed XY | - | - | - | ≤ 80 mm/s (3.1 in/s) |
| Repeatability precision XY | - | - | - | ≤ 0,01 mm (0.4 mils)(*1) |
| Usable sample placement area | 463 x 500 mm (18.2 x 19.7 in) | 463 x 500 mm (18.2 x 19.7 in) | 420 x 450 mm (16.5 x 17.7 in) | 300 x 350 mm (11.8 x 13.8 in) |
| Z axis | Fixed Position (Top/Middle/Bottom) | Electrically adjustable | Electrically adjustable | Programmable |
| Travel Z axis | - | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
| Max. sample weight | 20 kg (44 lb) | 20 kg (44 lb) | 20 kg (44 lb) | 5 kg (11 lb) / 20 kg (44 lb)(*2) |
| Max. sample height | 155/90/25 mm (6/3.5/1 in) | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
| Laser pointer (class 1) to support accurate sample placement |
- | - | Yes | Yes |
Power supply:AC 115 V or AC 230 V 50 / 60 Hz
Power consumption:max. 120 W, without evaluation PC
Protection class:IP40
External dimensions:Width x depth x height [mm]: 570 x 760 x 650 mm, [in]: 22 x 30 x 26
Interior dimensions:Width x depth x height [mm]: 460 x 495 x see max. sample height
measurement:
chamber:[in]: 18 x 19.5 x 26 x see max. sample height
Weight:XDL 210: 94 kg (207 lb); XDL 220: 99 kg (218 lb); XDL 230: 107 kg (235 lb);
XDL 240: 120 kg (264 lb)
Operating temperature:10 °C – 40 °C / 50 °F – 104 °F
Storage/Transport0 °C – 50 °C / 32 °F – 122 °F
temperature:
Admissible air humidity:≤ 95 %, non-condensing
CE approval:EN 61010
X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Fully protected instrument with type approval according to
theGerman regulations "Deutsche Röntgenverordnung-RöV".
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