Our Products Coating Thickness - EDXRF (Energy Dispersive X-ray Fluorescence) Electroplating and Electroless Coatings
Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations.
Software Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568
XDLM 231: Plane support stage, motor-driven Z-axis
XDLM 232: Manually operable XY-stage, motor-driven Z-axis
XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
Measurement of electroplated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on printed circuit boards
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to
determine thin coatings, small structures and alloys.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Top down
X-ray tube:Micro-focus tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):4x changeable
Standard (523-440):[mm]: Ø 0.1, Ø 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: Ø 3.9, Ø 7.9, 2 x 2, 7.9 x 1.2
Optional (523-366):[mm]: Ø 0.1, Ø 0.2, Ø 0.3, 0.3 x 0.05; [mils]: Ø 3.9, Ø 7.9, Ø 11.8, 11.8 x 2
Optional (524-061):[mm]: Ø 0.1, Ø 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: Ø 3.9, Ø 7.9, 11.8 x 2, 2 x 2
Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot: approx.
Ø 0.1 mm (3.9 mils) with aperture
0.05 x 0.05 mm (2 x 2 mils)
X-ray detector:Proportional counter tube
Measuring distance:0 … 80 mm (0 … 3.2 in)
Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.
Sample positioning:Manually
Video microscope:High-resolution CCD colour camera for optical monitoring of the
measurement locationalong the primary beam axis, manual focusing
and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator,
adjustable LED illumination,laser pointer (class 1) to support accurate
sample placement.
Zoom factor:Digital 1x, 2x, 3x, 4x
Computer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
| Sample Stage | |||
|---|---|---|---|
| XDLM 231 | XDLM 232 | XDLM 237 | |
| Design | Fixed sample Support | Manual XY-stage | Programmable XY-stage |
| Maximum travel XY | - | 95 x 150 mm (3.7 x 5.9 in) | 255 x 235 mm (10 x 9.2 in) |
| Travel speed XY | - | - | ≤ 80 mm/s (3.1 in/s) |
| Repeatability precision XY | - | - | ≤ 0,01 mm (0.4 mils)(*1) |
| Usable sample placement area | 463 x 500 mm (18.2 x 19.7 in) | 420 x 450 mm (16.5 x 17.7 in) | 300 x 350 mm (11.8 x 13.8 in) |
| Z axis | Electrically adjustable | Electrically adjustable | Programmable |
| Travel Z axis | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
| Max. sample weight | 20 kg (44 lb) | 20 kg (44 lb) | 5 kg (11 lb) / 20 kg (44 lb)(*2) |
| Max. sample height | 140 mm (5.5 in) | 140 mm (5.5 in) | 140 mm (5.5 in) |
Power supply:AC 115 V or AC 230 V 50 / 60 Hz
Power consumption:max. 120 W, without evaluation PC
Protection class:IP40
External dimensions:Width x depth x height [mm]: 570 x 760 x 650, [in]: 22 x 30 x 26
Interior dimensionsWidth x depth x height [mm]: 460 x 495 x 146, [in]: 18 x 19.5 x 5.7
measurement chamber:
Weight:XDLM 231: 100 kg/220 lbs; XDLM 232: 108 kg/238 lbs;
XDLM 237: 120 kg/265 lbs
Operating temperature:10 °C – 40 °C / 50 °F – 104 °F
Storage/Transport0 °C – 50 °C / 32 °F – 122 °F
temperature:
Admissible air humidity:≤ 95 %, non-condensing/p>
CE approval:EN 61010
X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Fully protected instrument with type approval according to
theGerman regulations "Deutsche Röntgenverordnung-RöV".
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